Amphenol's goal is to maximize manufacturing flexibility and minimize costs while speeding your products to market. We do this with:
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All sites are full integrated to ensure consistency in every operation and real-time communication.
All sites are qualified to the same rigorous quality and industry standards.
| Multiple backplane test platforms and layered test approach | ||
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Design for test | |
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Individualized test plans | |
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Diagnostic capabilities | |
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Fixtureless testing Ideal for low volume production |
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Speed product to market |
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Rapid feedback | |
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Reduced test costs | |
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Working prototypes | |
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Ideal for complex assemblies at low volumes | |
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Level II and III Isolation, continuity, and net resistance values |
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Dual-side (top and bottom) testing |
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Up to 88,000 points | |
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Dedicated fixture | |
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Oversized press capabilities | |
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In-Circuit Test |
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5,000 test points | |
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Analog test, vectorless test, digital and mixed-signal vector test, and boundary-scan test capabilities | |
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In-line device programming of Flash, EEPROM, and FPGAs | |
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Extended VXI card cage for integration of 3rd party C-sized VXI instruments | |
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Functional Test Performance verification and test of electronic assemblies |
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ILDP (In-Line Device Programming) for Flash and in-system programming | |
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Memory programming | |
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Basic functional test using analog instruments | |
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Boundary-scan testing | |
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Static digital testing | |
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Flexibility to move test to the appropriate point in production | |
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Customized power-up capabilities | |
| Other Test Capabilities | ||
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E-Prom device programmers |
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Optical test | |
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Hi-Pot test | |
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Dielectric withstanding | |
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X-Ray | |